Dependence of electrical resistivity on temperature and composition of Al–Cu alloys

نویسنده

  • H. Kaya
چکیده

Different compositions of Al–Cu alloys were directionally solidified upward with constant growth rate (V>18?6 mm s) and constant temperature gradient (G>4?7 K mm) using a Bridgman type growth apparatus. The variations in electrical resistivity r with temperature for directionally solidified Al–Cu alloys were measured in the range of 3732773 K using a standard four-point probe technique. According to the present experimental results, the resistivity of directionally solidified Al–Cu alloys linearly increases with increasing temperature and composition of Cu in the Al–Cu alloys. The variations in Lorenz number with the temperature and composition of Cu in the Al–Cu alloys were also determined from the Wiedemann–Franz law using the measured values of thermal and electrical conductivities for the same alloys.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Magnetic and Electerical Resistivity Behavior of Amorphous Ni Co P Films

Magnetic and Electrical Resistivity Study of Electroless Amorphous Ternary System (Ni-Co-P) show a qualitative dependence of crystalline phases formed during transformation on the annealing temperature and composition. Electrical Resistivity values increases with increase in cobalt content and samples with higher resistivity show lower temperature coefficients. The Initial increase in magnetiza...

متن کامل

A study on the dependence of DC electrical properties and nanostructure of Cu thin films on film thickness

This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...

متن کامل

A study on the dependence of DC electrical properties and nanostructure of Cu thin films on film thickness

This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...

متن کامل

Interplay between grain boundary segregation and electrical resistivity in dilute nanocrystalline Cu alloys

Article history: Received 10 February 2016 Received in revised form 22 May 2016 Accepted 8 June 2016 Available online xxxx The relationships betweenmicrostructure, controlled by alloying elements prone to grain boundary segregation, and electrical resistivity in sputtered nanocrystalline Cu were investigated. We find a non-monotonic dependence of themean grain size on solute concentration for b...

متن کامل

Measurement of low-temperature transport properties of Cu-based Cu-Zr-Ti bulk metallic glass

The transport properties, including electrical resistivity , thermopower S , and thermal conductivity of bulk metallic glass alloys Cu64Zr28.5Ti7.1, Cu62.3Zr23.7Ti10, Cu60.6Zr26.9Ti12.5 and Cu58.8Zr26.2Ti15 in the temperature range 10–300 K are reported. The temperature variations of electrical resistivity in these alloys, with a negative temperature coefficient, are found to be rather weak. Th...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2012